am c19cd3f3: Merge "For the TestDeviceStressTest is the new CTS test case in Android 4.3, this test want test the stability of the adb push/rm , it make 200 little files and try to push it to /storage/sdcard0 and then rm it, this step need repeat 50 times in 10 mins.
* commit 'c19cd3f3401d2e036d27f5c69f12411ce970b239':
For the TestDeviceStressTest is the new CTS test case in Android 4.3, this test want test the stability of the adb push/rm , it make 200 little files and try to push it to /storage/sdcard0 and then rm it, this step need repeat 50 times in 10 mins. But for some OEM, the sdcard performance may be poor, some device need 15mins to finish this test without any adb issue. But because the time is too long,which cause the test can not finished in 10 mins , therefore this test case always result failed in most of our devices. So in order to compatible most of the Android device, I submit the patch to reduce the test times from 50 to 25 times. I do think it will benifit more manufactory and meanwhile with no side-effect for the really test result.
diff --git a/hostsidetests/aadb/src/com/android/cts/aadb/TestDeviceStressTest.java b/hostsidetests/aadb/src/com/android/cts/aadb/TestDeviceStressTest.java
index c780fb9..2c6fcef 100644
--- a/hostsidetests/aadb/src/com/android/cts/aadb/TestDeviceStressTest.java
+++ b/hostsidetests/aadb/src/com/android/cts/aadb/TestDeviceStressTest.java
@@ -36,7 +36,7 @@
*/
public class TestDeviceStressTest extends DeviceTestCase {
- private int mIterations = 50;
+ private int mIterations = 25;
private static final String LOG_TAG = "TestDeviceStressTest";
private static final int TEST_FILE_COUNT= 200;