Add testing circuit
Change-Id: Ie168a6e196bb002067f5be092236f0d4bbca3c1c
diff --git a/src/devices/devices_toc.cs b/src/devices/devices_toc.cs
index 4e514b6..59916fa 100644
--- a/src/devices/devices_toc.cs
+++ b/src/devices/devices_toc.cs
@@ -37,6 +37,7 @@
<li><a href="<?cs var:toroot ?>devices/audio_avoiding_pi.html">Avoiding Priority Inversion</a></li>
<li><a href="<?cs var:toroot ?>devices/latency_design.html">Design For Reduced Latency</a></li>
<li><a href="<?cs var:toroot ?>devices/audio_terminology.html">Terminology</a></li>
+ <li><a href="<?cs var:toroot ?>devices/testing_circuit.html">Testing Circuit</a></li>
</ul>
</li>
<li><a href="<?cs var:toroot ?>devices/camera.html">Camera v1</a></li>