| commit | 21e4e940ed3ad172f344a3aa3faf1d8437441313 | [log] [tgz] |
|---|---|---|
| author | Michael Gottesman <mgottesman@apple.com> | Tue Apr 16 21:18:42 2013 +0000 |
| committer | Michael Gottesman <mgottesman@apple.com> | Tue Apr 16 21:18:42 2013 +0000 |
| tree | 40a437ae47ac7466d033c23f4f778a937e4fe8cd | |
| parent | ec4fbc6144c1edcd82ec71a16ee3d0dfb94dfeae [diff] |
[2/6] ARM Neon Intrinsic Tablegen Test Generator. This patch causes OpInst records to be silently identified with their Non-Op inst counterparts so that the same test generation infrastructure can be used to generate tests. Reviewed by Bob Wilson. git-svn-id: https://llvm.org/svn/llvm-project/cfe/trunk@179628 91177308-0d34-0410-b5e6-96231b3b80d8