Mark functions in some tests as 'nounwind'. Generating
EH info for these functions causes the tests to fail for
random reasons (e.g. looking for 'or' or counting lines
with asm-printer; labels count as lines.)
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@49003 91177308-0d34-0410-b5e6-96231b3b80d8
diff --git a/test/CodeGen/X86/2006-05-02-InstrSched1.ll b/test/CodeGen/X86/2006-05-02-InstrSched1.ll
index 1357419..d9ef5b0 100644
--- a/test/CodeGen/X86/2006-05-02-InstrSched1.ll
+++ b/test/CodeGen/X86/2006-05-02-InstrSched1.ll
@@ -5,7 +5,7 @@
@size20 = external global i32 ; <i32*> [#uses=1]
@in5 = external global i8* ; <i8**> [#uses=1]
-define i32 @compare(i8* %a, i8* %b) {
+define i32 @compare(i8* %a, i8* %b) nounwind {
%tmp = bitcast i8* %a to i32* ; <i32*> [#uses=1]
%tmp1 = bitcast i8* %b to i32* ; <i32*> [#uses=1]
%tmp.upgrd.1 = load i32* @size20 ; <i32> [#uses=1]