| commit | 80dfe0ceb31d92aca835d94f0255d93288e5ed12 | [log] [tgz] |
|---|---|---|
| author | Johan Hovold <jhovold@gmail.com> | Thu Mar 21 12:36:32 2013 +0100 |
| committer | Greg Kroah-Hartman <gregkh@linuxfoundation.org> | Mon Mar 25 13:44:17 2013 -0700 |
| tree | 4a2d1ad2f217cf004f770e437a1d832122f541ef | |
| parent | 853127faa43f4971c4e9fc506bb86622208ca935 [diff] |
USB: keyspan: remove bogus disconnect test in close Remove bogus (and unnecessary) test for serial->dev being NULL in close. The device is never cleared, and close is never called after a completed disconnect anyway. Remove some out-commented bogus code while at it. Signed-off-by: Johan Hovold <jhovold@gmail.com> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>