| commit | 19870da7ea2fc483bf73a189046a430fd9b01391 | [log] [tgz] |
|---|---|---|
| author | Thomas Gleixner <tglx@linutronix.de> | Fri Jul 15 14:53:51 2005 +0100 |
| committer | Thomas Gleixner <tglx@mtd.linutronix.de> | Sat Jul 16 09:27:52 2005 +0200 |
| tree | 3f8d07e75dc9895c52c2184d28e3c43a84b0234b | |
| parent | 2c4eec9802ae753a4973f0a0d71f8d154e86fd31 [diff] |
[MTD] NAND: Fix broken bad block scan for 16 bit devices The previous change to read a single byte from oob breaks the bad block scan on 16 bit devices, when the byte is on an odd address. Read the complete oob for now. Remove the unused arguments from check_short_pattern() Move the wait for ready function so it is only executed when consecutive reads happen. Signed-off-by: Thomas Gleixner <tglx@linutronix.de>