| commit | ba29becd770ffec90f3af896daffac6b9acec608 | [log] [tgz] |
|---|---|---|
| author | Xi Wang <xi.wang@gmail.com> | Wed Jul 08 14:00:56 2015 -0700 |
| committer | David S. Miller <davem@davemloft.net> | Wed Jul 08 16:19:53 2015 -0700 |
| tree | 96815c89643734aba98bd63bb68454dd92547eab | |
| parent | ca661a28887714ee2ebdcfe9e89fa2528fcbfbbf [diff] |
test_bpf: extend tests for 32-bit endianness conversion Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if the upper bits of the result are zeros (the arm64 JIT had such bugs). Extend the two tests to catch this. Acked-by: Daniel Borkmann <daniel@iogearbox.net> Acked-by: Alexei Starovoitov <ast@plumgrid.com> Signed-off-by: Xi Wang <xi.wang@gmail.com> Signed-off-by: David S. Miller <davem@davemloft.net>