IIO: core: Modify scan element type
The current scan element type uses the following format:
[be|le]:[s|u]bits/storagebits[>>shift].
To specify multiple elements in this type, added a repeat value.
So new format is:
[be|le]:[s|u]bits/storagebitsXr[>>shift].
Here r is specifying how may times, real/storage bits are repeating.
When X is value is 0 or 1, then repeat value is not used in the format,
and it will be same as existing format.
Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
diff --git a/include/linux/iio/iio.h b/include/linux/iio/iio.h
index 5629c92..ccde917 100644
--- a/include/linux/iio/iio.h
+++ b/include/linux/iio/iio.h
@@ -177,6 +177,12 @@
* shift: Shift right by this before masking out
* realbits.
* endianness: little or big endian
+ * repeat: Number of times real/storage bits
+ * repeats. When the repeat element is
+ * more than 1, then the type element in
+ * sysfs will show a repeat value.
+ * Otherwise, the number of repetitions is
+ * omitted.
* @info_mask_separate: What information is to be exported that is specific to
* this channel.
* @info_mask_shared_by_type: What information is to be exported that is shared
@@ -219,6 +225,7 @@
u8 realbits;
u8 storagebits;
u8 shift;
+ u8 repeat;
enum iio_endian endianness;
} scan_type;
long info_mask_separate;