| commit | f110176633d74bbac1f80ab9b9c6b83ea3e1cc23 | [log] [tgz] |
|---|---|---|
| author | Dan Williams <dan.j.williams@intel.com> | Wed Oct 17 10:47:19 2018 -0700 |
| committer | Dan Williams <dan.j.williams@intel.com> | Wed Oct 17 10:47:19 2018 -0700 |
| tree | f373f4a5ba3a6aaadbd54735b39fe4668fc27549 | |
| parent | 0ead11181fe0c9538b185e46a494df21dc7de23a [diff] |
tools/testing/nvdimm: Populate dirty shutdown data Allow the unit tests to verify the retrieval of the dirty shutdown count via smart commands, and allow the driver-load-time retrieval of the smart health payload to be simulated by nfit_test. Reviewed-by: Keith Busch <keith.busch@intel.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>