| commit | 6943f8af7d6583be57d67bba8b2644371f6a10ca | [log] [tgz] |
|---|---|---|
| author | David Woodhouse <dwmw2@infradead.org> | Sat May 13 16:14:26 2006 +0100 |
| committer | David Woodhouse <dwmw2@infradead.org> | Sat May 13 16:14:26 2006 +0100 |
| tree | b6c3842b6616b4878677c9bded3a12a6e99dda3d | |
| parent | 9d75414b4fa7390975ef0e2b56ff40425657fe52 [diff] |
[MTD NAND] Reduce paranoia level when scanning for bad blocks on virgin chips We were scanning for 0xFF through the entire chip -- which takes a while when it's a 512MiB device as I have on my current toy. The specs only say we need to check certain bytes -- so do only that. Signed-off-by: David Woodhouse <dwmw2@infradead.org>