| commit | 7406060e292c389fe6f38bd23493de9b57f2f4fc | [log] [tgz] |
|---|---|---|
| author | Wolfram Sang <w.sang@pengutronix.de> | Sun Oct 30 00:11:53 2011 +0200 |
| committer | Artem Bityutskiy <Artem.Bityutskiy@intel.com> | Sun Oct 30 14:31:04 2011 +0200 |
| tree | 1b88dfc908c3be01a86d74685a4329c69d2f9348 | |
| parent | 6be55f79a216ccb9f364476b12e5b151a5f6bdb6 [diff] |
mtd: tests: don't use mtd0 as a default mtd tests may erase the mtd device, so force the user to specify which mtd device to test by using the module parameter. Disable the default (using mtd0) since this may destroy a vital part of the flash if the module is inserted accidently or carelessly. Reported-by: Roland Kletzing <devzero@web.de> Signed-off-by: Wolfram Sang <w.sang@pengutronix.de> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@intel.com>