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gerrit-public.fairphone.software / platform / art / ad92535858a92627c0c00e8e0d0e83ca2e9842a9 / test / 626-checker-arm64-scratch-register
  1. b15e879 Verify ART run-tests' standard output and standard error separately. by Roland Levillain · 3 years, 11 months ago
  2. a073f46 Rename ART run-tests `expected.txt` files as `expected-stdout.txt`. by Roland Levillain · 3 years, 11 months ago
  3. 87beba3 Fix some typos in ART. by Roland Levillain · 5 years ago
  4. bb87891 ART-tests: Remove DX dependency from 626-checker-arm64-scratch-register. by Tamas Kenez · 6 years ago
  5. 88f1054 ART: Temporarily move 3 checker tests away from D8 by Orion Hodson · 6 years ago
  6. 942da61 Revert "Make arm64-scratch-register less dexer dependent" by Nicolas Geoffray · 7 years ago
  7. 39d764d Make arm64-scratch-register less dexer dependent by Alan Leung · 7 years ago
  8. 94cd28a Revert "Make arm64-scratch-register less dexer dependent" by Nicolas Geoffray · 7 years ago
  9. c82745f Make arm64-scratch-register less dexer dependent by Alan Leung · 7 years ago
  10. 426b49c ARM(64): Improve the code generated for HSelect by Donghui Bai · 8 years ago
  11. bc269a2 Adjust test 626 after ARM64 parallel move scratch register change. by Roland Levillain · 8 years ago
  12. 78b3d5d Revert "Revert "Avoid scratch register exhaustion during ARM64 stack slot moves."" by Roland Levillain · 8 years ago
  13. 122ceb4 Revert "Avoid scratch register exhaustion during ARM64 stack slot moves." by Nicolas Geoffray · 8 years ago
  14. 4ec76d2 Avoid scratch register exhaustion during ARM64 stack slot moves. by Roland Levillain · 8 years ago