This cl tries to fix cts tests IncidentdTest
1. Disable BatteryType section which is device-specific
2. Make timeout longer since meminfo section timedout in test
3. make some negative values sint
4. varint can be 64 bits, there is a bug implicitly convert it to 32
which loses values.
5. Found another bug which failed to read 64 bits varint, create a
native test to make sure it works.
Bug: 77291057
Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest
Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
diff --git a/cmds/incidentd/src/PrivacyBuffer.cpp b/cmds/incidentd/src/PrivacyBuffer.cpp
index 6cd2fe1..d753e5e 100644
--- a/cmds/incidentd/src/PrivacyBuffer.cpp
+++ b/cmds/incidentd/src/PrivacyBuffer.cpp
@@ -34,7 +34,7 @@
void PrivacyBuffer::writeFieldOrSkip(uint32_t fieldTag, bool skip) {
uint8_t wireType = read_wire_type(fieldTag);
size_t bytesToWrite = 0;
- uint32_t varint = 0;
+ uint64_t varint = 0;
switch (wireType) {
case WIRE_TYPE_VARINT: