This cl tries to fix cts tests IncidentdTest
1. Disable BatteryType section which is device-specific
2. Make timeout longer since meminfo section timedout in test
3. make some negative values sint
4. varint can be 64 bits, there is a bug implicitly convert it to 32
which loses values.
5. Found another bug which failed to read 64 bits varint, create a
native test to make sure it works.
Bug: 77291057
Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest
Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
diff --git a/libs/protoutil/AndroidTest.xml b/libs/protoutil/AndroidTest.xml
new file mode 100644
index 0000000..46d418e
--- /dev/null
+++ b/libs/protoutil/AndroidTest.xml
@@ -0,0 +1,26 @@
+<?xml version="1.0" encoding="utf-8"?>
+<!-- Copyright (C) 2018 The Android Open Source Project
+
+ Licensed under the Apache License, Version 2.0 (the "License");
+ you may not use this file except in compliance with the License.
+ You may obtain a copy of the License at
+
+ http://www.apache.org/licenses/LICENSE-2.0
+
+ Unless required by applicable law or agreed to in writing, software
+ distributed under the License is distributed on an "AS IS" BASIS,
+ WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ See the License for the specific language governing permissions and
+ limitations under the License.
+-->
+<configuration description="Config for libprotoutil_test">
+ <target_preparer class="com.android.tradefed.targetprep.PushFilePreparer">
+ <option name="cleanup" value="true" />
+ <option name="push" value="libprotoutil_test->/data/nativetest/libprotoutil_test" />
+ </target_preparer>
+ <option name="test-suite-tag" value="apct" />
+ <test class="com.android.tradefed.testtype.GTest" >
+ <option name="native-test-device-path" value="/data/nativetest" />
+ <option name="module-name" value="libprotoutil_test" />
+ </test>
+</configuration>