Increase ANR test timeouts
Currently, when running the ANR tests on the cloud device, we
occasionally observe failures.
There are several failures, and one of them is explained as follows:
when we call setInputWindows, a FOCUS(hasFocus=true) event is generated
for the focused window. The focused window needs to respond to the FOCUS
event.
But currently, we are setting a 10 ms dispatching timeout for the focused
window. That means the focused window needs to respond to the FOCUS
event within 10 ms.
This happens most of the time, but on cuttlefish, this amount of time
isn't always sufficient. Even changing this to 20 ms, I found cases
where the test flakes.
The timeouts were originally set to 10 ms to speed up the tests, and
were tested on physical devices, but not stress tested on cf.
To fix the immediate issue, increase the timeouts.
We could also have fixed it by doing the following:
Set a long timeout, process FOCUS event, then set a short timeout and
call setInputWindows again. I decided against that approach because it's
more complicated.
Bug: 159489444
Test: adb shell /data/nativetest/inputflinger_tests/inputflinger_tests --gtest_repeat=100000 --gtest_break_on_failure --gtest_filter='*WindowAnr*'
Change-Id: I61b27550f812c60738310b6cf1c0c2ed7bb86dc8
1 file changed