commit | 3629df4086da9fdf1c5b4c1f0e23f6081e5c6df7 | [log] [tgz] |
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author | Jiyong Park <jiyong@google.com> | Tue Jul 28 15:03:35 2020 +0900 |
committer | Jiyong Park <jiyong@google.com> | Tue Jul 28 15:09:11 2020 +0900 |
tree | 2b0bd37a03364af44878c5d38e981dfdc91e0172 | |
parent | 0f0652858603abcf10aa5ecfc8141a7c1e643c9f [diff] |
Make the instrumentation test better 1. The failure is determined using the same regular expression that we use in tradefed. 2. When the instrumentation fails, the output is directly printed to the console. Bug: 162211592 Test: run `atest aidl_integration_test` after injecting an intentional error. The failure is detected and the failed method (along with stack track) is printed. Change-Id: I1e0ae0a97d4f0b7fba310d8da1f3a2e1292cf194
Documentation for this project is currently maintained here:
https://source.android.com/devices/architecture/aidl/overview