Merge "Update test timeout for OEMCrypto unit tests" into pi-dev
am: c196ba00a9

Change-Id: I4b652e1eac48e8f2dbf9c77d6eb47f21fc3ce458
diff --git a/res/config/google/test/framework/media/widevine/tests/widevine-oemcrypto.xml b/res/config/google/test/framework/media/widevine/tests/widevine-oemcrypto.xml
index 73e5f76..748f4bc 100644
--- a/res/config/google/test/framework/media/widevine/tests/widevine-oemcrypto.xml
+++ b/res/config/google/test/framework/media/widevine/tests/widevine-oemcrypto.xml
@@ -12,6 +12,9 @@
         <option name="negative-testname-filter" value="OEMCryptoKeyboxTest.GetKeyDataNullPointer" />
         <option name="before-test-cmd" value="pm disable com.google.android.gms/com.google.android.gms.droidguard.DroidGuardService" />
         <option name="after-test-cmd" value="pm enable com.google.android.gms/com.google.android.gms.droidguard.DroidGuardService" />
+        <!-- native-test-timeout unit is ms, value = 10 min -->
+        <!-- updated for UsageTableTest:TwoHundredEntries which takes around 4 minutes -->
+        <option name="native-test-timeout" value="600000" />
     </test>
     <test class="com.android.tradefed.testtype.GTest">
         <option name="native-test-device-path" value="/data/bin" />