sdm: Add support for compliance test mode for DP
1. Add functionality in qdutils to get the DP test config from the
sysfs node.
2. Add support to generate ColorRamp, ColorSquare and Black and White
vertical line test pattern for 18/24/30 bpp DP display
3. Create layer stack with test layer and ignore all layers from the
SF framework.
4. Generate the pattern with 18/24/30 bpp based on pattern type and
bpp read from sysfs node and send it to DP interface.
5. Add support to calculate CRC to validate the color pattern.
Change-Id: I49469d94a96ada729d24d7cc03a7e79f2af6edc0
CRs-Fixed: 1107663
diff --git a/libqdutils/qd_utils.h b/libqdutils/qd_utils.h
index 4722dcd..5e8d1bf 100644
--- a/libqdutils/qd_utils.h
+++ b/libqdutils/qd_utils.h
@@ -1,5 +1,5 @@
/*
- * Copyright (C) 2013, The Linux Foundation. All rights reserved.
+ * Copyright (C) 2013, 2017 The Linux Foundation. All rights reserved.
*
* Redistribution and use in source and binary forms, with or without
* modification, are permitted provided that the following conditions are
@@ -59,10 +59,11 @@
MAX_STRING_LENGTH = 1024,
};
-int parseLine(char *input, char *tokens[], const uint32_t maxToken, uint32_t *count);
int querySDEInfo(HWQueryType type, int *value);
int getEdidRawData(char *buffer);
int getHDMINode(void);
+bool isDPConnected();
+int getDPTestConfig(uint32_t *panelBpp, uint32_t *patternType);
}; //namespace qdutils
#endif