Wei Wang | c6f3339 | 2018-10-22 15:48:28 -0700 | [diff] [blame^] | 1 | <?xml version="1.0" encoding="utf-8"?> |
| 2 | <!-- Copyright (C) 2018 The Android Open Source Project |
| 3 | |
| 4 | Licensed under the Apache License, Version 2.0 (the "License"); |
| 5 | you may not use this file except in compliance with the License. |
| 6 | You may obtain a copy of the License at |
| 7 | |
| 8 | http://www.apache.org/licenses/LICENSE-2.0 |
| 9 | |
| 10 | Unless required by applicable law or agreed to in writing, software |
| 11 | distributed under the License is distributed on an "AS IS" BASIS, |
| 12 | WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. |
| 13 | See the License for the specific language governing permissions and |
| 14 | limitations under the License. |
| 15 | --> |
| 16 | <configuration description="Config for VTS VtsHalThermalV2_0Target test cases"> |
| 17 | <option name="config-descriptor:metadata" key="plan" value="vts-hal" /> |
| 18 | <target_preparer class="com.android.compatibility.common.tradefed.targetprep.VtsFilePusher"> |
| 19 | <option name="push-group" value="HalHidlTargetTest.push"/> |
| 20 | </target_preparer> |
| 21 | <test class="com.android.tradefed.testtype.VtsMultiDeviceTest"> |
| 22 | <option name="test-module-name" value="VtsHalThermalV2_0Target"/> |
| 23 | <option name="binary-test-source" value="_32bit::DATA/nativetest/VtsHalThermalV2_0TargetTest/VtsHalThermalV2_0TargetTest"/> |
| 24 | <option name="binary-test-source" value="_64bit::DATA/nativetest64/VtsHalThermalV2_0TargetTest/VtsHalThermalV2_0TargetTest"/> |
| 25 | <option name="binary-test-type" value="hal_hidl_gtest"/> |
| 26 | <option name="binary-test-disable-framework" value="true"/> |
| 27 | <option name="test-timeout" value="15m"/> |
| 28 | </test> |
| 29 | </configuration> |